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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
Pulse porosity (Holiday) detector. Detects pinholes in coatings and wrapping above 150µm on metal substrates such as pipes and tanks. Can..
DC Porosity (Holiday) detector. Detects pinholes in coatings above 150um on metal substrates such as pipes and tanks. 0-30kV, 3.5 digit L..
Comprises an LCD display and a detachable detector/drive unit. Parameters measured in Ra, Rq, Ry, Rz, Rt, Rp, R3z, Rk, Rpk, Rvk, S, Sm, Pc,..
Measures the force required to pull a specified test diameter of coating away from its substrate using hydraulic pressure. Pressure is di..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis
